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Analysis of radiation damage in silicon charge-coupled devices used for dark matter searches

by Steven J. Lee

This Submission thread is now published as

Submission summary

Authors (as registered SciPost users): Steven Lee
Submission information
Preprint Link:  (pdf)
Date accepted: 2023-03-09
Date submitted: 2022-11-08 10:32
Submitted by: Lee, Steven
Submitted to: SciPost Physics Proceedings
Proceedings issue: 14th International Conference on Identification of Dark Matter (IDM2022)
Ontological classification
Academic field: Physics
  • Condensed Matter Physics - Computational
  • High-Energy Physics - Experiment
  • Nuclear Physics - Experiment
Approach: Experimental


Nuclear recoils in crystal detectors generate radiation damage in the form of crystal defects that can be measured in scientific-grade CCDs as local hot spots of leakage current stimulated by temperature increases in the devices. In this proceeding, we use a neutron source to generate defects in DAMIC-M CCDs, and using increases in leakage current at different temperatures, we demonstrate a procedure for identifying crystal defects in the CCDs of the DAMIC-M experiment. This is the first time that individual defects generated from nuclear recoils have been studied. This technique could be used to distinguish nuclear recoils from electron recoils in some energy ranges, which would improve the ability of CCD detectors to search for weakly interacting dark matter.

List of changes

X in Figure 2 have been described as unidentified defect species with specific bandgap deformation in the text. I've also added a separate citation for the left of Figure 2.
A new version has been submitted to arXiV and submission to Scipost will follow when available.

Published as SciPost Phys. Proc. 12, 030 (2023)

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