SciPost logo

Analysis of radiation damage in silicon charge-coupled devices used for dark matter searches

Steven J. Lee

SciPost Phys. Proc. 12, 030 (2023) · published 4 July 2023

Proceedings event

14th International Conference on Identification of Dark Matter


Nuclear recoils in crystal detectors generate radiation damage in the form of crystal defects that can be measured in scientific-grade CCDs as local hot spots of leakage current stimulated by temperature increases in the devices. In this proceeding, we use a neutron source to generate defects in DAMIC-M CCDs, and using increases in leakage current at different temperatures, we demonstrate a procedure for identifying crystal defects in the CCDs of the DAMIC-M experiment. This is the first time that individual defects generated from nuclear recoils have been studied. This technique could be used to distinguish nuclear recoils from electron recoils in some energy ranges, which would improve the ability of CCD detectors to search for weakly interacting dark matter.

Author / Affiliation: mappings to Contributors and Organizations

See all Organizations.
Funders for the research work leading to this publication