TY  - JOUR
PB  - SciPost Foundation
DO  - 10.21468/SciPostPhysProc.12.030
TI  - Analysis of radiation damage in silicon charge-coupled devices used for dark matter searches
PY  - 2023/07/04
UR  - https://www.scipost.org/SciPostPhysProc.12.030
JF  - SciPost Physics Proceedings
JA  - SciPost Phys. Proc.
VL  - 
IS  - 12
SP  - 030
A1  - Lee, Steven J.
AB  - Nuclear recoils in crystal detectors generate radiation damage in the form of crystal defects that can be measured in scientific-grade CCDs as local hot spots of leakage current stimulated by temperature increases in the devices. In this proceeding, we use a neutron source to generate defects in DAMIC-M CCDs, and using increases in leakage current at different temperatures, we demonstrate a procedure for identifying crystal defects in the CCDs of the DAMIC-M experiment. This is the first time that individual defects generated from nuclear recoils have been studied. This technique could be used to distinguish nuclear recoils from electron recoils in some energy ranges, which would improve the ability of CCD detectors to search for weakly interacting dark matter.
ER  -

@Article{10.21468/SciPostPhysProc.12.030,
	title={{Analysis of radiation damage in silicon charge-coupled devices used for dark matter searches}},
	author={Steven J. Lee},
	journal={SciPost Phys. Proc.},
	pages={030},
	year={2023},
	publisher={SciPost},
	doi={10.21468/SciPostPhysProc.12.030},
	url={https://scipost.org/10.21468/SciPostPhysProc.12.030},
}